Yin, W. and Dickinson, S. J. and Peyton, A. J. (2005) A multi-frequency impedance analyser for electrical tomography systems. In: Proceedings of the 4th world congress on industrial process tomography :. UNSPECIFIED, pp. 30-35.
Full text not available from this repository.Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? ta engineering (general). civil engineering (general) ??
Departments:
ID Code:
20098
Deposited By:
Deposited On:
10 Dec 2008 11:42
Refereed?:
No
Published?:
Published
Last Modified:
16 Jul 2024 01:40