A multi-frequency impedance analyser for electrical tomography systems.

Yin, W. and Dickinson, S. J. and Peyton, A. J. (2005) A multi-frequency impedance analyser for electrical tomography systems. In: Proceedings of the 4th world congress on industrial process tomography. UNSPECIFIED, pp. 30-35.

Full text not available from this repository.
Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 20098
Deposited By: ep_ss_importer
Deposited On: 10 Dec 2008 11:42
Refereed?: No
Published?: Published
Last Modified: 14 Aug 2019 03:48
URI: https://eprints.lancs.ac.uk/id/eprint/20098

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