A multi-frequency impedance analyser for electrical tomography systems.

Yin, W. and Dickinson, S. J. and Peyton, A. J. (2005) A multi-frequency impedance analyser for electrical tomography systems. In: Proceedings of the 4th world congress on industrial process tomography. UNSPECIFIED, pp. 30-35.

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
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ID Code:
20098
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Deposited On:
10 Dec 2008 11:42
Refereed?:
No
Published?:
Published
Last Modified:
16 Nov 2020 02:04