Chilingarov, Alexandre (2006) DC bias circuit effects in CV measurements. In: 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, 2006-10-16 - 2006-10-18.
![[thumbnail of Chilingarov_RD50CERN06.ppt]](https://eprints.lancs.ac.uk/style/images/fileicons/application_vnd.ms-powerpoint.png)
Abstract
A DC bias circuit is a necessary part of CV measurement set-up. The effects of this circuit on the measured parameters are simulated and compared with experimental data. Reconstruction of the actual DUT characteristics is considered.
Item Type:
Contribution to Conference
(Speech)
Journal or Publication Title:
9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
?? qc physics ??
Departments:
ID Code:
19914
Deposited By:
Deposited On:
19 Nov 2008 14:15
Refereed?:
No
Published?:
Published
Last Modified:
15 Jul 2024 08:07