DC bias circuit effects in CV measurements.

Chilingarov, Alexandre (2006) DC bias circuit effects in CV measurements. In: 9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, 2006-10-162006-10-18.

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Abstract

A DC bias circuit is a necessary part of CV measurement set-up. The effects of this circuit on the measured parameters are simulated and compared with experimental data. Reconstruction of the actual DUT characteristics is considered.

Item Type:
Contribution to Conference (Speech)
Journal or Publication Title:
9th RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
ID Code:
19914
Deposited By:
Deposited On:
19 Nov 2008 14:15
Refereed?:
No
Published?:
Published
Last Modified:
31 Mar 2020 23:57