Orientation Analysis and its Applications in Image Analysis

Tovey, N. Keith and Hounslow, Mark W. and Wang, Jianmin (1995) Orientation Analysis and its Applications in Image Analysis. Advances in Imaging and Electron Physics, 93 (C). pp. 219-329. ISSN 1076-5670

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Abstract

This chapter discusses the applications of orientation analysis for microfabric studies and many different formulations of edge detectors as the merits of these are of widespread interest. With the advent of image processing and analysis techniques, there are now several methods, whereby quantification of microfabric is possible and a review of the latest developments in this field and particularly those related to orientation analysis are the subject of this chapter. In all quantitative techniques using image analysis, there are five key states—namely, (1) definition of the task, (2) image acquisition, (3) image processing, including image restoration, enhancement, edge detection, (4) image analysis, including analysis of orientation data and enhanced application of orientation analysis (e.g, domain-segmentation) and, (5) interpretation of results. The chapter focuses on both image processing and analysis. The chapter presents the edge detection and orientation analysis algorithms, which includes the development of basic formulae and also the postprocessing of results in the form of indices of anisotropy. The chapter discusses the development of general formulae for orientation analysis and a comprehensive test of many of the available formulae, including the extension of analysis using rectangular pixels and also the extension of the algorithm to three dimensions. Enhanced orientation analysis, including domain segmentation and domain mapping are discussed. Applications of orientation analysis with other techniques in image analysis, including porosity and multispectral methods are presented in the chapter.

Item Type:
Journal Article
Journal or Publication Title:
Advances in Imaging and Electron Physics
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
?? NUCLEAR AND HIGH ENERGY PHYSICSCONDENSED MATTER PHYSICSELECTRICAL AND ELECTRONIC ENGINEERING ??
ID Code:
168266
Deposited By:
Deposited On:
06 Apr 2022 15:00
Refereed?:
Yes
Published?:
Published
Last Modified:
19 Sep 2023 02:47