ULTRARAM:A Low-Energy, High-Endurance, Compound-Semiconductor Memory on Silicon

Hodgson, Peter and Lane, Dominic and Carrington, Peter and Delli, Evangelia and Beanland, Richard and Hayne, Manus (2022) ULTRARAM:A Low-Energy, High-Endurance, Compound-Semiconductor Memory on Silicon. Advanced Electronic Materials, 8 (4). ISSN 2199-160X

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Abstract

ULTRARAM is a nonvolatile memory with the potential to achieve fast, ultralow-energy electron storage in a floating gate accessed through a triple-barrier resonant tunneling heterostructure. Here its implementation is reported on a Si substrate; a vital step toward cost-effective mass production. Sample growth using molecular beam epitaxy commences with deposition of an AlSb nucleation layer to seed the growth of a GaSb buffer layer, followed by the III–V memory epilayers. Fabricated single-cell memories show clear 0/1 logic-state contrast after ≤10 ms duration program/erase pulses of ≈2.5 V, a remarkably fast switching speed for 10 and 20 µm devices. Furthermore, the combination of low voltage and small device capacitance per unit area results in a switching energy that is orders of magnitude lower than dynamic random access memory and flash, for a given cell size. Extended testing of devices reveals retention in excess of 1000 years and degradation-free endurance of over 107 program/erase cycles, surpassing very recent results for similar devices on GaAs substrates.

Item Type:
Journal Article
Journal or Publication Title:
Advanced Electronic Materials
Subjects:
ID Code:
164465
Deposited By:
Deposited On:
12 Jan 2022 12:31
Refereed?:
Yes
Published?:
Published
Last Modified:
07 Dec 2022 00:43