Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields

Engelberg, Eliyahu Zvi and Paszkiewicz, Jan and Peacock, Ruth and Lachmann, Sagy and Ashkenazy, Yinon and Wuensch, Walter (2020) Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields. Physical Review Accelerators and Beams, 23 (12). ISSN 2469-9888

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Abstract

Breakdown of metals subject to intense electric fields is a long-standing limiting factor in high-voltage applications. The mechanism leading to breakdown nucleation is not completely understood. Previously, it was suggested that breakdown can be nucleated by a critical transition in the population of mobile dislocations near the surface of electrodes. This was formulated in terms of a mean-field mobile dislocation density fluctuation (MDDF) model. Based on this model, it was proposed that prebreakdown fluctuations of the mobile dislocation density might be observed as spikes in the dark current between the electrodes. We constructed a setup in which these fluctuations were measured. The rate of fluctuations, as a function of the electric field between the electrodes, agrees with the predictions of the MDDF model, both in functional form and in absolute numerical rates. This numerical agreement was obtained using previously derived numerical parameters of the model. In addition, for each electric field, the distribution of times between current fluctuations was examined. The results indicate that each such prebreakdown fluctuation is the result of a two-step process. This characteristic, too, is in line with the MDDF model, which predicts that a characteristic prebreakdown current event is described as two separate steps in a Markov process, occurring in quick succession.

Item Type:
Journal Article
Journal or Publication Title:
Physical Review Accelerators and Beams
ID Code:
157016
Deposited By:
Deposited On:
09 Jul 2021 15:45
Refereed?:
Yes
Published?:
Published
Last Modified:
30 Nov 2021 16:43