Beam Exit Cross-Sectional Polishing (BEXP) and Functional SPM - New Approach for 3D Mapping of Physical Properties of Nanostructures

Mucientes, Marta and Kolosov, Oleg (2019) Beam Exit Cross-Sectional Polishing (BEXP) and Functional SPM - New Approach for 3D Mapping of Physical Properties of Nanostructures. In: 2019 MRS Fall Meeting & Exhibit, 2019-12-012019-12-06, Hynes Convention Center.

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Item Type:
Contribution to Conference (Other)
Journal or Publication Title:
2019 MRS Fall Meeting & Exhibit
ID Code:
143602
Deposited By:
Deposited On:
29 Apr 2020 15:20
Refereed?:
No
Published?:
Published
Last Modified:
19 Aug 2020 00:14