Beam Exit Cross-Sectional Polishing (BEXP) and Functional SPM - New Approach for 3D Mapping of Physical Properties of Nanostructures

Mucientes, Marta and Kolosov, Oleg (2019) Beam Exit Cross-Sectional Polishing (BEXP) and Functional SPM - New Approach for 3D Mapping of Physical Properties of Nanostructures. In: 2019 MRS Fall Meeting & Exhibit, 2019-12-012019-12-06, Hynes Convention Center.

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Item Type:

Contribution to Conference (Other)

Journal or Publication Title:

2019 MRS Fall Meeting & Exhibit

Departments:

Faculty of Science and Technology > Physics

ID Code:

143602

Deposited By:

ep_importer_pure

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