Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging

Wan, Quan and Abrams, Kerry J. and Masters, Robert C. and Talari, Abdullah C. S. and Rehman, Ihtesham U. and Claeyssens, Frederik and Holland, Chris and Rodenburg, Cornelia (2017) Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging. Advanced Materials, 29 (47). ISSN 0935-9648

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Abstract

Nanostructures underpin the excellent properties of silk. Although the bulk nanocomposition of silks is well studied, direct evidence of the spatial variation of nanocrystalline (ordered) and amorphous (disordered) structures remains elusive. Here, secondary electron hyperspectral imaging can be exploited for direct imaging of hierarchical structures in carbon‐based materials, which cannot be revealed by any other standard characterization methods. Through applying this technique to silks from domesticated (Bombyx mori) and wild (Antheraea mylitta) silkworms, a variety of previously unseen features are reported, highlighting the local interplay between ordered and disordered structures. This technique is able to differentiate composition on the nanoscale and enables in‐depth studies into the relationship between morphology and performance of these complex biopolymer systems.

Item Type:
Journal Article
Journal or Publication Title:
Advanced Materials
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2210
Subjects:
ID Code:
132737
Deposited By:
Deposited On:
12 Apr 2019 15:00
Refereed?:
Yes
Published?:
Published
Last Modified:
09 Sep 2020 05:55