Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale

Liang, X.Z. and Dodge, M.F. and Jiang, J. and Dong, H.B. (2019) Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale. Ultramicroscopy, 197. pp. 39-45. ISSN 0304-3991

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Abstract

It is challenging to quantify the geometrically necessary dislocation (GND) density at the nanoscale using conventional electron backscatter diffraction due to its limited spatial resolution. To overcome this problem, in this study, the transmission Kikuchi diffraction (TKD) technique is used to measure lattice orientation and to calculate the corresponding nanoscale GND density. Using the TKD method, a variation of GND density from 6 × 1014 to 1016 m−2 has been measured in a welded super duplex stainless steel sample. The distribution of dislocation density is shown to be in good agreement with transmission electron microscope (TEM) result. Compared with dislocation measurements obtained by TEM, the TKD–GND method is revealed to be a relatively accurate, fast and accessible method. © 2018

Item Type:
Journal Article
Journal or Publication Title:
Ultramicroscopy
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2500/2504
Subjects:
ID Code:
129432
Deposited By:
Deposited On:
17 Dec 2019 12:40
Refereed?:
Yes
Published?:
Published
Last Modified:
08 Jul 2020 08:04