Room-temperature single dopant atom quantum dot transistors in silicon, formed by field-emission scanning probe lithography

Durrani, Zahid A. K. and Jones, Mervyn E. and Abualnaja, Faris and Wang, Chen and Kaestner, Marcus and Lenk, Steve and Lenk, Claudia and Rangelow, Ivo W. and Andreev, Aleksey (2018) Room-temperature single dopant atom quantum dot transistors in silicon, formed by field-emission scanning probe lithography. Journal of Applied Physics, 124 (14). ISSN 0021-8979

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Abstract

Electrical operation of room-temperature (RT) single dopant atom quantum dot (QD) transistors, based on phosphorous atoms isolated within nanoscale SiO2 tunnel barriers, is presented. In contrast to single dopant transistors in silicon, where the QD potential well is shallow and device operation limited to cryogenic temperature, here, a deep (∼2 eV) potential well allows electron confinement at RT. Our transistors use ∼10 nm size scale Si/SiO2/Si point-contact tunnel junctions, defined by scanning probe lithography and geometric oxidation. “Coulomb diamond” charge stability plots are measured at 290 K, with QD addition energy ∼0.3 eV. Theoretical simulation gives a QD size of similar order to the phosphorous atom separation ∼2 nm. Extraction of energy states predicts an anharmonic QD potential, fitted using a Morse oscillator-like potential. The results extend single-atom transistor operation to RT, enable tunneling spectroscopy of impurity atoms in insulators, and allow the energy landscape for P atoms in SiO2 to be determined.

Item Type:
Journal Article
Journal or Publication Title:
Journal of Applied Physics
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100
Subjects:
ID Code:
128291
Deposited By:
Deposited On:
21 Oct 2019 12:50
Refereed?:
Yes
Published?:
Published
Last Modified:
27 Oct 2020 08:28