Fokianos, K. and Qin, J. and Kedem, B. and Short, D.A. (2001) Semiparametric approach to the one-way layout. Technometrics, 43 (1). pp. 56-65. ISSN 0040-1706
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Official URL: https://doi.org/10.1198/00401700152404327
Item Type:
Journal Article
Journal or Publication Title:
Technometrics
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2600/2613
Subjects:
?? CASE-CONTROL DATAEMPIRICAL LIKELIHOODEXPONENTIAL TILTLOGISTIC REGRESSIONREFERENCE DISTRIBUTIONSMOOTH GOODNESS OF FITMODELLING AND SIMULATIONAPPLIED MATHEMATICSSTATISTICS AND PROBABILITY ??
Departments:
ID Code:
127891
Deposited By:
Deposited On:
03 Oct 2018 13:16
Refereed?:
Yes
Published?:
Published
Last Modified:
17 Sep 2023 02:22