Fokianos, K. and Qin, J. and Kedem, B. and Short, D.A. (2001) Semiparametric approach to the one-way layout. Technometrics, 43 (1). pp. 56-65. ISSN 0040-1706
Full text not available from this repository.Item Type:
Journal Article
Journal or Publication Title:
Technometrics
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2600/2611
Subjects:
?? case-control dataempirical likelihoodexponential tiltlogistic regressionreference distributionsmooth goodness of fitmodelling and simulationapplied mathematicsstatistics and probability ??
Departments:
ID Code:
127891
Deposited By:
Deposited On:
03 Oct 2018 13:16
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Jul 2024 18:24