Benchmarking of electro-optic monitors for femtosecond electron bunches

Berden, G. and Gillespie, W.A. and Jamison, S.P. and Knabbe, E.-A. and MacLeod, A.M. and Van Der Meer, A.F.G. and Phillips, P.J. and Schlarb, H. and Schmidt, B. and Schmüser, P. and Steffen, B. (2007) Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical review letters, 99 (16). ISSN 1079-7114

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Abstract

The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.

Item Type:
Journal Article
Journal or Publication Title:
Physical review letters
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100
Subjects:
ID Code:
125940
Deposited By:
Deposited On:
18 Jun 2018 08:46
Refereed?:
Yes
Published?:
Published
Last Modified:
26 Aug 2020 03:38