Foreword to "Using Imperfect Semiconductor Systems for Unique Identification"

Young, Robert James (2017) Foreword to "Using Imperfect Semiconductor Systems for Unique Identification". In: Using Imperfect Semiconductor Systems for Unique Identification. Springer Theses . Springer, Cham. ISBN 9783319678900

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Abstract

This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.

Item Type:
Contribution in Book/Report/Proceedings
ID Code:
124834
Deposited By:
Deposited On:
23 Apr 2018 14:16
Refereed?:
No
Published?:
Published
Last Modified:
28 Oct 2020 08:57