Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

Banón-Caballero, David and Socuellamos, Juan and Mata, Rafael and Mercadé, Laura and Gimeno, Benito and Boria, Vicente and Raboso, David and Semenov, Vladimir and Rakova, Elena and Sánchez-Royo, Juan and Segura, Alfredo (2018) Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. IEEE Transactions on Plasma Science, 46 (4). pp. 859-867. ISSN 0093-3813

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Abstract

Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

Item Type:
Journal Article
Journal or Publication Title:
IEEE Transactions on Plasma Science
Additional Information:
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Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/3100/3106
Subjects:
ID Code:
123964
Deposited By:
Deposited On:
09 Mar 2018 14:10
Refereed?:
Yes
Published?:
Published
Last Modified:
31 Mar 2020 05:18