Richardson, A. M. D. and Dorey, A. P. (1992) Supply current monitoring in cmos circuits for reliability prediction and test. Quality and Reliability Engineering International, 8 (6). pp. 543-548. ISSN 1099-1638
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Official URL: https://doi.org/10.1002/qre.4680080606
Abstract
The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.
Item Type:
Journal Article
Journal or Publication Title:
Quality and Reliability Engineering International
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? IDDQ • RELIABILITY TESTING • RELIABILITY INDICATORS • SUPPLY CURRENT TESTING • VLSI TESTINGMANAGEMENT SCIENCE AND OPERATIONS RESEARCHSAFETY, RISK, RELIABILITY AND QUALITYTA ENGINEERING (GENERAL). CIVIL ENGINEERING (GENERAL) ??
Departments:
ID Code:
20711
Deposited By:
Deposited On:
25 Nov 2008 14:53
Refereed?:
No
Published?:
Published
Last Modified:
17 Sep 2023 00:23