Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

Harvey, R. J. A. and Richardson, A. M. D. and Bruls, E. M. J. and Baker, K. (1993) Test evaluation for complex mixed signal ICs by introducing layout dependent faults. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. UNSPECIFIED, London, 6/1-8.

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? TA ENGINEERING (GENERAL). CIVIL ENGINEERING (GENERAL) ??
ID Code:
20629
Deposited By:
Deposited On:
02 Dec 2008 09:08
Refereed?:
No
Published?:
Published
Last Modified:
21 Nov 2022 13:20