A design for testability study on a high performance automatic gain control circuit.
Lechner, A. and Richardson, A. M. D. and Hermes, B. and Ohletz, M.
(1998)
A design for testability study on a high performance automatic gain control circuit.
In:
Proceedings of the 16th IEEE VLSI test symposium :.
IEEE, pp. 376-385.
![[thumbnail of 20376.pdf]](https://eprints.lancs.ac.uk/20376/1.hassmallThumbnailVersion/20376.pdf)
Preview
Abstract
A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presented
Item Type:
Contribution in Book/Report/Proceedings
Additional Information:
"©1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? ta engineering (general). civil engineering (general) ??
Deposited On:
17 Dec 2008 16:40
Last Modified:
23 Feb 2024 01:33