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Interatomic force microscope and sample observing method therefor

YAMANAKA, K (1996) Interatomic force microscope and sample observing method therefor. G01B 11/30; G01B 21/30-JP2535759 (B2).

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    PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

    Item Type: Patent
    Uncontrolled Keywords: Atomic force microscopy ; nonlinearity ; nanomechanics ; nanotechnology
    Subjects: ?? qc ??
    ?? 30 ??
    Departments: Faculty of Science and Technology > Physics
    ID Code: 58947
    Deposited By: ep_importer_pure
    Deposited On: 30 Oct 2012 15:43
    Refereed?: No
    Published?: Published
    Last Modified: 18 Jun 2018 02:06
    Identification Number: G01B 11/30; G01B 21/30-JP2535759 (B2)

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