YAMANAKA, K (1996) Interatomic force microscope and sample observing method therefor. G01B 11/30; G01B 21/30-JP2535759 (B2).
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PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.
|Uncontrolled Keywords:||Atomic force microscopy ; nonlinearity ; nanomechanics ; nanotechnology|
|Subjects:||?? qc ??|
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|Departments:||Faculty of Science and Technology > Physics|
|Deposited On:||30 Oct 2012 15:43|
|Last Modified:||25 Mar 2017 00:17|
|Identification Number:||G01B 11/30; G01B 21/30-JP2535759 (B2)|
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