Equipment and apparatus for measuring physical properties of material with high throughput

Hajduk , Damian (2004) Equipment and apparatus for measuring physical properties of material with high throughput. GO1N 3/00;.

[thumbnail of Japanese patent - front page]
Preview
PDF (Japanese patent - front page)
JP_3543088_B2_txt.pdf - Published Version
Available under License None.

Download (191kB)

Abstract

Multipurpose apparatus for screening a combination library with high throughput. SOLlITION: The apparatus comprising sample holder for holding the components of 8 library, probe array for perturbing an independent library component mechanically, and a sensor array for measuring response to mechanical perturbation of each library component. During scraening operation, the apparatus replaces the sample array (sample holder) and the probe array and perturbs an Independent library-component mechanically. A material sample tested based on a large number of different bulk physical properties including Young's modulus (bending, uniaxial drawing, biaxial drawing, tearing), hardened indentation), fracture (toughness) adhesion, flow viscosity, melt flow Index, rheology).

Item Type:
Patent
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
?? HIGH THROUGHPUT SCREENINGCOMBINATORIAL MATERIALS DISCOVERYPOLYMERSFILMSMECHANICAL PROPERTYPARALLEL MEASUREMENTSPHYSICSQC PHYSICS ??
?? 00; ??
ID Code:
58946
Deposited By:
Deposited On:
30 Oct 2012 15:40
Refereed?:
No
Published?:
Published
Last Modified:
12 Sep 2023 00:11