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Direct nanoscale 3D characterisation of Ge-Sb-Te and Ge-Te phase change films

Grishin, Ilja and Kolosov, Oleg (2012) Direct nanoscale 3D characterisation of Ge-Sb-Te and Ge-Te phase change films. In: NSTI-Nanotech 2012. CRC PRESS-TAYLOR & FRANCIS GROUP, Santa Clara, USA, pp. 75-78. ISBN 9781466562745

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Abstract

Atomic Foce Micoscopy is an especially useful tool in studying biological systems, because not only can they image and manipulate samples at molecular resolution, they can do so in physiological conditions – in liquid, and in air if desired as well as provide direct nanomechanical characterisation, which are essential for understanding the formation principles of these systems and the molecular mechanisms that govern their unique functionality. Nacre (mother-of-pearl), Amyloid fibres and lipid bilayer liposomes were the subject of Ultrasonic Force Microscopy (UFM) investigation.

Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: phase change materials; nanomechanics; 3D imaging; subsurface; ultrasonic force microscopy; UFM; AFM; SPM
Subjects: Q Science > QC Physics
Departments: Faculty of Science and Technology > Physics
ID Code: 58428
Deposited By: ep_importer_pure
Deposited On: 18 Sep 2012 12:25
Refereed?: No
Published?: Published
Last Modified: 25 Mar 2014 10:09
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/58428

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