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Pulsed laser deposited tetrahedral amorphous carbon with high sp(3) fractions and low optical bandgaps

Miyajima, Yoji and Henley, S. J. and Adamopoulos, George and Stolojan, V. and Garcia-Caurel, E. and Drévillon, B. and Shannon, J. M. and Silva, S. R. P. (2009) Pulsed laser deposited tetrahedral amorphous carbon with high sp(3) fractions and low optical bandgaps. Journal of Applied Physics, 105 (7). 073521. ISSN 0021-8979

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Amorphous carbon films with sp(3) bonded carbon fractions over 70% are deposited by pulsed laser deposition. However, the optical bandgap obtained from optical transmittance and spectroscopic ellipsometry analysis shows the values to be below 1.0 eV. A wide range of measurements such as electron energy loss spectroscopy, visible Raman, spectroscopic ellipsometry, optical transmittance, and electrical characterization are performed to elucidate the bonding configurations that dictate microstructural, optical and electrical properties, and their linkage to band structure changes. It is found that stress-induced electronic localized states play an important role in the physical properties of the films deposited. The optical bandgap is shown not to be a good measure of the electrical bandgap, especially for high electric field conduction in these tetrahedral amorphous carbon films.

Item Type: Journal Article
Journal or Publication Title: Journal of Applied Physics
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 57784
Deposited By: ep_importer_pure
Deposited On: 22 Aug 2012 14:26
Refereed?: Yes
Published?: Published
Last Modified: 23 Feb 2018 05:34
Identification Number:

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