Inagaki, K. and Kolosov, Oleg and Briggs, G. Andrew D. and Muto, S. and Horisaki, Y. and Wright, O. B. (1998) Ultrasonic force microscopy in waveguide mode up to 100 MHz. In: Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE. IEEE, New York, pp. 1255-1259. ISBN 0-7803-4096-5Full text not available from this repository.
We present experimental results that extend the frequency range of ultrasonic force microscopy (UFM) to 100 MHz, operating in a mode in which the cantilever base is vibrated. In this "waveguide-UFM" mode flexural ultrasonic vibrations are launched down the cantilever as in a waveguide, without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected using an optical lever at the modulation frequency in an conventional atomic force microscope. Experiments were performed on a sample of InAs self-assembled quantum dots on a GaAs substrate. The dots, of order 10-100 nm in diameter, were clearly resolved up to operating frequencies similar to 100 MHZ, demonstrating the difference in elastic properties. Images were also obtained for a polycrystalline chromium film structure deposited on a silicon substrate.
|Item Type:||Contribution in Book/Report/Proceedings|
|Subjects:||Q Science > QC Physics|
|Departments:||Faculty of Science and Technology > Physics|
|Deposited On:||09 Oct 2012 09:16|
|Last Modified:||09 Oct 2012 09:16|
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