Inagaki, K. and Kolosov, Oleg and Briggs, G. Andrew D. and Muto, S. and Horisaki, Y. and Wright, O. B. (1998) Ultrasonic force microscopy in waveguide mode up to 100 MHz. In: Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE. IEEE, New York, pp. 1255-1259. ISBN 0-7803-4096-5
Full text not available from this repository.Abstract
We present experimental results that extend the frequency range of ultrasonic force microscopy (UFM) to 100 MHz, operating in a mode in which the cantilever base is vibrated. In this "waveguide-UFM" mode flexural ultrasonic vibrations are launched down the cantilever as in a waveguide, without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected using an optical lever at the modulation frequency in an conventional atomic force microscope. Experiments were performed on a sample of InAs self-assembled quantum dots on a GaAs substrate. The dots, of order 10-100 nm in diameter, were clearly resolved up to operating frequencies similar to 100 MHZ, demonstrating the difference in elastic properties. Images were also obtained for a polycrystalline chromium film structure deposited on a silicon substrate.
| Item Type: | Contribution in Book/Report/Proceedings |
|---|---|
| Subjects: | Q Science > QC Physics |
| Departments: | Faculty of Science and Technology > Physics |
| ID Code: | 57438 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 09 Oct 2012 09:16 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 09 Oct 2012 09:16 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/57438 |
Actions (login required)
| View Item |
