Inagaki, K. and Kolosov, Oleg and Briggs, G. Andrew D. and Wright, O. B. (2000) Waveguide ultrasonic force microscopy at 60 MHz. Applied Physics Letters, 76 (14). pp. 1836-1838. ISSN 0003-6951Full text not available from this repository.
We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.
|Journal or Publication Title:||Applied Physics Letters|
|Subjects:||Q Science > QC Physics|
|Departments:||Faculty of Science and Technology > Physics|
|Deposited On:||09 Oct 2012 09:51|
|Last Modified:||27 Feb 2017 02:46|
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