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Waveguide ultrasonic force microscopy at 60 MHz

Inagaki, K. and Kolosov, Oleg and Briggs, G. Andrew D. and Wright, O. B. (2000) Waveguide ultrasonic force microscopy at 60 MHz. Applied Physics Letters, 76 (14). pp. 1836-1838. ISSN 0003-6951

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We present measurements using ultrasonic force microscopy at similar to 60 MHz, operating in a "waveguide" mode in which the cantilever base is vibrated and flexural ultrasonic vibrations are launched down the cantilever without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected in a conventional atomic force microscope. Images of Ge quantum dots on a Si substrate show contrast related to elasticity and adhesion differences, and this is interpreted with the Johnson-Kendall-Roberts model of the force-distance curve.

Item Type: Journal Article
Journal or Publication Title: Applied Physics Letters
Subjects: ?? qc ??
Departments: Faculty of Science and Technology > Physics
ID Code: 57436
Deposited By: ep_importer_pure
Deposited On: 09 Oct 2012 09:51
Refereed?: Yes
Published?: Published
Last Modified: 22 May 2018 03:40
Identification Number:

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