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Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy

Kolosov, Oleg and Castell, Martin R. and Marsh, Chris D. and Briggs, G. Andrew D. and Kamins, T. I. and Williams, R. Stanley (1998) Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy. Physical review letters, 81 (5). pp. 1046-1049. ISSN 0031-9007

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Abstract

The structure of nanometer-sized strained Ce islands epitaxially grown on a Si substrate was studied using ultrasonic force microscopy (UFM), which combines the sensitivity to elastic structure of acoustic microscopy with the nanoscale spatial resolution of atomic force microscopy. UFM not only images the local surface elasticity variations between the Ge dots and the substrate with a spatial resolution of about 5 nm, but is also capable of detecting the strain variation across the dot, via the modification of the local stiffness.

Item Type: Article
Journal or Publication Title: Physical review letters
Subjects: Q Science > QC Physics
Departments: Faculty of Science and Technology > Physics
ID Code: 57427
Deposited By: ep_importer_pure
Deposited On: 07 Oct 2012 17:04
Refereed?: Yes
Published?: Published
Last Modified: 10 Apr 2014 00:01
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/57427

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