Chekanov, A. S. and Low, T. S. and Alli, S. and Kolosov, Oleg and Briggs, Andrew (1996) Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. IEEE Transactions on Magnetics, 32 (5). pp. 3696-3698. ISSN 0018-9464Full text not available from this repository.
Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina.
|Journal or Publication Title:||IEEE Transactions on Magnetics|
|Subjects:||Q Science > QC Physics|
|Departments:||Faculty of Science and Technology > Physics|
|Deposited On:||07 Oct 2012 16:15|
|Last Modified:||03 Dec 2016 03:17|
Actions (login required)