Lancaster EPrints

Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks

Chekanov, A. S. and Low, T. S. and Alli, S. and Kolosov, Oleg and Briggs, Andrew (1996) Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. IEEE Transactions on Magnetics, 32 (5). pp. 3696-3698. ISSN 0018-9464

Full text not available from this repository.

Abstract

Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina.

Item Type: Article
Journal or Publication Title: IEEE Transactions on Magnetics
Subjects: Q Science > QC Physics
Departments: Faculty of Science and Technology > Physics
ID Code: 57422
Deposited By: ep_importer_pure
Deposited On: 07 Oct 2012 16:15
Refereed?: Yes
Published?: Published
Last Modified: 10 Apr 2014 00:00
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/57422

Actions (login required)

View Item