Lancaster EPrints

Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy

Gruverman, Alexei and Kolosov, Oleg and Hatano, Jun and Takahashi, Koichiro and Tokumoto, H. (1995) Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy. Journal of Vacuum Science and Technology B, 13 (3). pp. 1095-1099. ISSN 1071-1023

Full text not available from this repository.

Abstract

The ferroelectric domain structure and its dynamics under applied electric field have been studied with nanoscale resolution by atomic force microscopy (AFM). Two mechanisms responsible for the contrast between opposite domains are proposed: large built‐in domains are delineated in friction mode due to the tip–sample electrostatic interaction, and small domains created by an external field are imaged in topography mode due to piezoelectric deformation of the crystal. The ability of effective control of ferroelectric domains by applying a voltage between the AFM tip and the bottom electrode is demonstrated. It is experimentally confirmed that the sidewise growth of domain proceeds through the nucleation process on the domain wall.

Item Type: Article
Journal or Publication Title: Journal of Vacuum Science and Technology B
Subjects: Q Science > QC Physics
Departments: Faculty of Science and Technology > Physics
ID Code: 57413
Deposited By: ep_importer_pure
Deposited On: 07 Oct 2012 15:02
Refereed?: Yes
Published?: Published
Last Modified: 10 Apr 2014 00:00
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/57413

Actions (login required)

View Item