Gruverman, Alexei and Kolosov, Oleg and Hatano, Jun and Takahashi, Koichiro and Tokumoto, H. (1995) Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy. Journal of Vacuum Science and Technology B, 13 (3). pp. 1095-1099. ISSN 1071-1023
Full text not available from this repository.Abstract
The ferroelectric domain structure and its dynamics under applied electric field have been studied with nanoscale resolution by atomic force microscopy (AFM). Two mechanisms responsible for the contrast between opposite domains are proposed: large built‐in domains are delineated in friction mode due to the tip–sample electrostatic interaction, and small domains created by an external field are imaged in topography mode due to piezoelectric deformation of the crystal. The ability of effective control of ferroelectric domains by applying a voltage between the AFM tip and the bottom electrode is demonstrated. It is experimentally confirmed that the sidewise growth of domain proceeds through the nucleation process on the domain wall.
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | Journal of Vacuum Science and Technology B |
| Subjects: | Q Science > QC Physics |
| Departments: | Faculty of Science and Technology > Physics |
| ID Code: | 57413 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 07 Oct 2012 15:02 |
| Refereed?: | Yes |
| Published?: | Published |
| Last Modified: | 07 Oct 2012 15:02 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/57413 |
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