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Fast prediction and optimization of yield in gallium arsenide large-signal MMICs

D'Agostino, S and Paoloni, C (1998) Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. International journal of rf and microwave computer-Aided engineering, 8 (1). pp. 68-76. ISSN 1096-4290

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Abstract

A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.

Item Type: Article
Journal or Publication Title: International journal of rf and microwave computer-Aided engineering
Uncontrolled Keywords: yield ; optimization ; nonlinear circuits ; MMIC
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 56565
Deposited By: ep_importer_pure
Deposited On: 08 Aug 2012 19:26
Refereed?: Yes
Published?: Published
Last Modified: 24 Jan 2014 05:29
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/56565

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