D'Agostino, S and Paoloni, C (1998) Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. International Journal of RF and Microwave Computer-Aided Engineering, 8 (1). pp. 68-76. ISSN 1096-4290Full text not available from this repository.
A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.
|Journal or Publication Title:||International Journal of RF and Microwave Computer-Aided Engineering|
|Uncontrolled Keywords:||yield ; optimization ; nonlinear circuits ; MMIC|
|Subjects:||?? ta ??|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||08 Aug 2012 19:26|
|Last Modified:||28 Apr 2017 03:12|
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