D'Agostino, S and Paoloni, C (1998) Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. International journal of rf and microwave computer-Aided engineering, 8 (1). pp. 68-76. ISSN 1096-4290
Full text not available from this repository.Abstract
A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | International journal of rf and microwave computer-Aided engineering |
| Uncontrolled Keywords: | yield ; optimization ; nonlinear circuits ; MMIC |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 56565 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 08 Aug 2012 19:26 |
| Refereed?: | Yes |
| Published?: | Published |
| Last Modified: | 20 Aug 2012 16:53 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/56565 |
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