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On the Analysis and Improvement of Yield for TWT Small-Signal Gain

Paoloni, Claudio (2008) On the Analysis and Improvement of Yield for TWT Small-Signal Gain. IEEE Transactions on Electron Devices, 55 (10). pp. 2774-2778. ISSN 0018-9383

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Abstract

Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degradation is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fabrication step requires higher accuracy.

Item Type: Article
Journal or Publication Title: IEEE Transactions on Electron Devices
Uncontrolled Keywords: Slow-wave structure ; statistical analysis ; tolerance ; traveling-wave tube (TWT) ; yield
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 56537
Deposited By: ep_importer_pure
Deposited On: 07 Aug 2012 13:58
Refereed?: Yes
Published?: Published
Last Modified: 24 Jan 2014 05:28
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/56537

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