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Excess avalanche noise in In0.52Al0.48As

Goh, Y. L. and Marshall, A. R. J. and Massey, D. J. and Ng, J. S. and Tan, C. H. and Hopkinson, M. and David, J. P. R. and Jones, S. K. and Button, C. C. and Pinches, S. M. (2007) Excess avalanche noise in In0.52Al0.48As. IEEE Journal of Quantum Electronics, 43 (5-6). pp. 503-507. ISSN 0018-9197

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Avalanche multiplication and excess noise arising from both electron and hole injection have been measured on a series of In0.52Al0.48As p(+)-i-n(+) and n(+)-i-p(+) diodes with nominal avalanche region widths between 0.1 and 2.5 mu m. With pure electron injection, low excess noise was measured at values corresponding to effective kappa = ss/alpha between 0.15 and 0.25 for all widths. Enabled ionization coefficients were deduced using a non-local ionization model utilizing recurrence equation techniques covering an electric field range from approximately 200 kV/cm to 1 MV/cm.

Item Type: Journal Article
Journal or Publication Title: IEEE Journal of Quantum Electronics
Subjects: ?? qc ??
Departments: Faculty of Science and Technology > Physics
ID Code: 54610
Deposited By: ep_importer_pure
Deposited On: 28 May 2012 11:57
Refereed?: Yes
Published?: Published
Last Modified: 15 May 2018 03:35
Identification Number:

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