Richardson, Andrew and De-Venuto, Daniela (2004) Testing high resolution SD ADC’s by using the noise transfer function. In: 9th IEEE European Test Symposium, 2004-05-232004-05-26.
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A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.
|Item Type:||Conference or Workshop Item (Paper)|
|Journal or Publication Title:||9th IEEE European Test Symposium|
|Uncontrolled Keywords:||ADC test ; Mixed Signal Test ; Sigma Delta Test ; Design for Testability|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||16 Nov 2011 13:54|
|Last Modified:||06 Feb 2017 00:07|
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