Lancaster EPrints

Testing high resolution SD ADC’s by using the noise transfer function

Richardson, Andrew and De-Venuto, Daniela (2004) Testing high resolution SD ADC’s by using the noise transfer function. In: 9th IEEE European Test Symposium, 2004-05-232004-05-26, Corsica.

[img]
Preview
PDF (Testing High Resolution SD ADC's using Noise Transfer Function) - Submitted Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.

Download (617Kb) | Preview

    Abstract

    A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.

    Item Type: Conference or Workshop Item (Paper)
    Journal or Publication Title: 9th IEEE European Test Symposium
    Uncontrolled Keywords: ADC test ; Mixed Signal Test ; Sigma Delta Test ; Design for Testability
    Subjects:
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 51081
    Deposited By: ep_importer_pure
    Deposited On: 16 Nov 2011 13:54
    Refereed?: Yes
    Published?: Published
    Last Modified: 24 Jan 2014 06:15
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/51081

    Actions (login required)

    View Item