Richardson, Andrew and Rosing, Richard and Peyton, Anthony and Dorey, Anthony (1999) Test support strategies for MEMS. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18.
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Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.
|Item Type:||Conference or Workshop Item (Paper)|
|Journal or Publication Title:||5th IEEE International Mixed Signal Testing Workshop|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||15 Nov 2011 16:27|
|Last Modified:||06 Jan 2017 00:10|
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