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Test support strategies for MEMS

Richardson, Andrew and Rosing, Richard and Peyton, Anthony and Dorey, Anthony (1999) Test support strategies for MEMS. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18, Whistler.

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    Abstract

    Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.

    Item Type: Conference or Workshop Item (Paper)
    Journal or Publication Title: 5th IEEE International Mixed Signal Testing Workshop
    Subjects: UNSPECIFIED
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 51061
    Deposited By: ep_importer_pure
    Deposited On: 15 Nov 2011 16:27
    Refereed?: Yes
    Published?: Published
    Last Modified: 10 Apr 2014 02:46
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/51061

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