Lancaster EPrints

An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

Richardson, Andrew and Sharif, Erfaan and Dorey, Anthony (1998) An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. In: 4th IEEE International Mixed-Signal Testing Workshop, 1998-06-081998-06-11, The Hague.

[img]
Preview
PDF - Submitted Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.

Download (978Kb) | Preview

    Abstract

    An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration. The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.

    Item Type: Conference or Workshop Item (Paper)
    Journal or Publication Title: 4th IEEE International Mixed-Signal Testing Workshop
    Uncontrolled Keywords: sensor test ; fault tolerance
    Subjects:
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 51057
    Deposited By: ep_importer_pure
    Deposited On: 15 Nov 2011 15:55
    Refereed?: No
    Published?: Published
    Last Modified: 24 Jan 2014 06:15
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/51057

    Actions (login required)

    View Item