Richardson, Andrew and Sharif, Erfaan and Dorey, Anthony (1998) An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. In: 4th IEEE International Mixed-Signal Testing Workshop, 1998-06-081998-06-11, The Hague.
|PDF - Submitted Version |
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (978Kb) | Preview
An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration. The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.
|Item Type:||Conference or Workshop Item (Paper)|
|Journal or Publication Title:||4th IEEE International Mixed-Signal Testing Workshop|
|Uncontrolled Keywords:||sensor test ; fault tolerance|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||15 Nov 2011 15:55|
|Last Modified:||27 Jul 2012 02:25|
Actions (login required)