Lancaster EPrints

Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613.

Full text not available from this repository.
Item Type: Article
Journal or Publication Title: Quality Engineering
Uncontrolled Keywords: Microsystems ; Smart sensors ; Self-test ; Testability ; Diagnosis ; Quality
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 50865
Deposited By: ep_importer_pure
Deposited On: 08 Nov 2011 11:35
Refereed?: Yes
Published?: Published
Last Modified: 24 Jan 2014 05:22
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/50865

Actions (login required)

View Item