Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613.

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Item Type:	Article
Journal or Publication Title:	Quality Engineering
Uncontrolled Keywords:	Microsystems ; Smart sensors ; Self-test ; Testability ; Diagnosis ; Quality
Subjects:	UNSPECIFIED
Departments:	Faculty of Science and Technology > Engineering
ID Code:	50865
Deposited By:	ep_importer_pure
Deposited On:	08 Nov 2011 11:35
Refereed?:	Yes
Published?:	Published
Last Modified:	26 Jul 2012 19:44
Identification Number:
URI:	http://eprints.lancs.ac.uk/id/eprint/50865

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