Lancaster EPrints

Fault simulation for MEMS

Rosing, R. and Richardson, A. and Dorey, A. and Peyton, A. (1999) Fault simulation for MEMS. In: Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. UNSPECIFIED, 7/1 -7/6.

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Abstract

Integrated test technology is becoming critically important for MEMS due to the high reliability and safety critical applications targeted. High quality levels in production require efficient test strategies that are properly validated. Fault simulation and testability analysis are critical utilities required to support this process. This paper will discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market

Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: BIST ; MEMS ; behavioural modelling ; failure mode analysis ; fault modelling ; fault simulation ; integrated test technology ; lumped modelling ; mechatronic interfaces ; test support ; testability analysis ; micromechanical devices
Subjects: UNSPECIFIED
Departments: Faculty of Science and Technology > Engineering
ID Code: 50462
Deposited By: ep_importer_pure
Deposited On: 21 Oct 2011 09:27
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 06:00
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/50462

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