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Editorial: Mixed signal & analogue IC test technology

Richardson, A and Dorey, T (1996) Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems, 143 (6). p. 357. ISSN 1350-2409

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Item Type: Article
Journal or Publication Title: IEE Proceedings - Circuits, Devices and Systems
Subjects: UNSPECIFIED
Departments: Faculty of Science and Technology > Engineering
ID Code: 50460
Deposited By: ep_importer_pure
Deposited On: 20 Oct 2011 16:35
Refereed?: Yes
Published?: Published
Last Modified: 09 Apr 2014 22:46
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/50460

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