Richardson, A and Dorey, T (1996) Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems, 143 (6). p. 357. ISSN 1350-2409
Full text not available from this repository.Official URL: http://dx.doi.org/10.1049/ip-cds:19960955
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | IEE Proceedings - Circuits, Devices and Systems |
| Subjects: | UNSPECIFIED |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 50460 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 20 Oct 2011 16:35 |
| Refereed?: | Yes |
| Published?: | Published |
| Last Modified: | 26 Jul 2012 19:39 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/50460 |
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