Olbrich, T and Richardson, A (1996) Design and self-test for switched-current building blocks. IEEE Design and Test of Computers, 13 (2). pp. 10-17. ISSN 0740-7475Full text not available from this repository.
This switched-current memory cell with a built-in self-test option serves as a building block for a range of analog functions. As an example application, the authors present a divide-by-two circuit for reference signal generation in algorithmic A/D converters. They also describe two self-test approaches for these building blocks and evaluate their effectiveness. The self-test functions are easy to apply, require very little overhead, and result in fault coverage up to 95% for shorts and 60% for open circuits. Analysis reveals that 100% testability may not be achievable in a cost-effective way for mixed-signal circuits.
|Journal or Publication Title:||IEEE Design and Test of Computers|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||20 Oct 2011 16:39|
|Last Modified:||03 Nov 2015 15:04|
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