Olbrich, T and Richardson, A (1996) Design and self-test for switched-current building blocks. Ieee design & test of computers, 13 (2). pp. 10-17. ISSN 0740-7475
Full text not available from this repository.Abstract
This switched-current memory cell with a built-in self-test option serves as a building block for a range of analog functions. As an example application, the authors present a divide-by-two circuit for reference signal generation in algorithmic A/D converters. They also describe two self-test approaches for these building blocks and evaluate their effectiveness. The self-test functions are easy to apply, require very little overhead, and result in fault coverage up to 95% for shorts and 60% for open circuits. Analysis reveals that 100% testability may not be achievable in a cost-effective way for mixed-signal circuits.
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | Ieee design & test of computers |
| Subjects: | UNSPECIFIED |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 50459 |
| Deposited By: | ep_importer_pure |
| Deposited On: | 20 Oct 2011 16:39 |
| Refereed?: | Yes |
| Published?: | Published |
| Last Modified: | 26 Jul 2012 19:39 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/50459 |
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