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Theory of electron trapping by micropores in tight-binding solids

LAMBERT, C J and HUGHES, G D (1986) Theory of electron trapping by micropores in tight-binding solids. Journal of Physics C: Solid State Physics, 19 (28). L659-L665. ISSN 0022-3719

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Abstract

The authors develop a theoretical description of the trapping of electrons by voids in a tight-binding solid. A new microscopic model is introduced in which the internal pore surfaces are parametrised by dimensionless ratios R and eta . Critical values Rc and eta c of these ratios exist at which the fraction f of bound states at the pores vanishes. For a small pore embedded in a finite solid, numerical results for the bound state energies and their degree of localisation are presented. For larger pores in an infinite solid analytic results are obtained. On the basis of these results, the authors examine the possibility that field-dependent losses found experimentally in RF sputtered semiconductors are due to the trapping of electrons by voids and suggest that the field effect arises through transitions between bound pore states and nearby localised states.

Item Type: Article
Journal or Publication Title: Journal of Physics C: Solid State Physics
Subjects: UNSPECIFIED
Departments: Faculty of Science and Technology > Physics
ID Code: 49668
Deposited By: ep_importer_pure
Deposited On: 08 Sep 2011 14:55
Refereed?: Yes
Published?: Published
Last Modified: 09 Apr 2014 22:41
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/49668

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