Lancaster EPrints

Towards chemical mapping at sub-micron resolution : near-field spectroscopic delineation of interphase boundaries.

Pollock, Hubert M. (2010) Towards chemical mapping at sub-micron resolution : near-field spectroscopic delineation of interphase boundaries. Materials Science Forum, 662. pp. 1-11. ISSN 0255-5476

This is the latest version of this item.

[img]
Preview
PDF (Pollock_revised_with_colour_on-line_figures.pdf)
Download (390Kb) | Preview

    Abstract

    Several of the authors of this collection of papers presented at the international meeting on the mechanical behaviour of materials have been working continuously in that field for several decades. In contrast, in this instance we have an example of an author who, having some experience in nanoindentation and surface - mechanical research, now pursues interdisciplinary studies of nanoscale properties in a different field. This paper discusses how a near-field version of infrared microspectroscopy, together with multivariate data analysis points a way towards a new method for identifying biomarkers for use in biomedical evaluation procedures. We also outline some details of a non-statistical method of classification, employing fuzzy logic.

    Item Type: Article
    Journal or Publication Title: Materials Science Forum
    Uncontrolled Keywords: microspectroscopy ; sub-micro ; PTMS ; PTIR ; PCA-LDA ; fuzzy rule ; eClas ; biomarkers ; adult stem cell
    Subjects: Q Science > QC Physics
    Departments: Faculty of Science and Technology > Physics
    ID Code: 34292
    Deposited By: Dr H M Pollock
    Deposited On: 28 Sep 2010 10:55
    Refereed?: Yes
    Published?: Published
    Last Modified: 26 Jul 2012 17:35
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/34292

    Available Versions of this Item

    Actions (login required)

    View Item