Lei, Ci and Pamunuwa, Dinesh Bandara and Bailey, Stephen and Lambert, Colin (2009) Designing reliable digital molecular electronic circuits. In: Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering . Springer, Berlin, pp. 111-115. ISBN 978-3-642-04849-4Full text not available from this repository.
Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.
|Item Type:||Contribution in Book/Report/Proceedings|
|Uncontrolled Keywords:||molecular electronics ; circuit simulation ; nanotechnology|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
Q Science > QC Physics
|Departments:||Faculty of Science and Technology > Engineering|
Faculty of Science and Technology > Physics
|Deposited By:||Mr Richard Ingham|
|Deposited On:||01 Feb 2010 09:17|
|Last Modified:||04 Nov 2015 05:08|
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