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Progress in near-field photothermal infra-red microspectroscopy.

Hammiche, A. and Bozec, L. and Pollock, Hubert M. and German, M. and Reading, M. (2004) Progress in near-field photothermal infra-red microspectroscopy. Journal of Microscopy, 213 (2). pp. 129-134. ISSN 0022-2720

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Abstract

Near-field photothermal Fourier transform infra-red microspectroscopy, which utilizes atomic force microscopy (AFM)-type temperature sensors, is being developed with the aim of achieving a spatial resolution higher than the diffraction limit. Here we report on a new implementation of the technique. Sensitivity of the technique is assessed by recording infra-red spectra from small quantities of analytes and thin films. A photothermomechanical approach, which utilizes conventional AFM probes as temperature sensors, is also discussed based on preliminary results. Early indication suggests that the photothermal approach is more sensitive than the thermomechanical one.

Item Type: Article
Journal or Publication Title: Journal of Microscopy
Uncontrolled Keywords: AFM • diffraction limit • FTIR spectroscopy
Subjects: Q Science > QC Physics
Departments: Faculty of Science and Technology > Physics
ID Code: 23877
Deposited By: ep_ss_importer
Deposited On: 23 Feb 2009 09:17
Refereed?: Yes
Published?: Published
Last Modified: 26 Jul 2012 16:17
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/23877

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