Hammiche, A. and Bozec, L. and Pollock, Hubert M. and German, M. and Reading, M. (2004) Progress in near-field photothermal infra-red microspectroscopy. Journal of Microscopy, 213 (2). pp. 129-134. ISSN 0022-2720Full text not available from this repository.
Near-field photothermal Fourier transform infra-red microspectroscopy, which utilizes atomic force microscopy (AFM)-type temperature sensors, is being developed with the aim of achieving a spatial resolution higher than the diffraction limit. Here we report on a new implementation of the technique. Sensitivity of the technique is assessed by recording infra-red spectra from small quantities of analytes and thin films. A photothermomechanical approach, which utilizes conventional AFM probes as temperature sensors, is also discussed based on preliminary results. Early indication suggests that the photothermal approach is more sensitive than the thermomechanical one.
|Journal or Publication Title:||Journal of Microscopy|
|Uncontrolled Keywords:||AFM • diffraction limit • FTIR spectroscopy|
|Subjects:||Q Science > QC Physics|
|Departments:||Faculty of Science and Technology > Physics|
|Deposited On:||23 Feb 2009 09:17|
|Last Modified:||26 Jul 2012 16:17|
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