Richardson, A. M. D. and Dorey, A. P. (1992) Supply current monitoring in cmos circuits for reliability prediction and test. Quality and Reliability Engineering International, 8 (6). pp. 543-548.Full text not available from this repository.
The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.
|Journal or Publication Title:||Quality and Reliability Engineering International|
|Uncontrolled Keywords:||IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||25 Nov 2008 14:53|
|Last Modified:||26 Jul 2012 15:39|
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