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Supply current monitoring in cmos circuits for reliability prediction and test.

Richardson, A. M. D. and Dorey, A. P. (1992) Supply current monitoring in cmos circuits for reliability prediction and test. Quality and Reliability Engineering International, 8 (6). pp. 543-548.

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Abstract

The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.

Item Type: Article
Journal or Publication Title: Quality and Reliability Engineering International
Uncontrolled Keywords: IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20711
Deposited By: ep_ss_importer
Deposited On: 25 Nov 2008 14:53
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:16
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20711

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