Richardson, A. M. D. and Dorey, A. P. (1992) Supply current monitoring in cmos circuits for reliability prediction and test. Quality and Reliability Engineering International, 8 (6). pp. 543-548.
Full text not available from this repository.Official URL: http://dx.doi.org/10.1002/qre.4680080606
Abstract
The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.
| Item Type: | Article |
|---|---|
| Journal or Publication Title: | Quality and Reliability Engineering International |
| Uncontrolled Keywords: | IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 20711 |
| Deposited By: | ep_ss_importer |
| Deposited On: | 25 Nov 2008 14:53 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 26 Jul 2012 15:39 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/20711 |
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