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Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

Harvey, R. J. A. and Richardson, A. M. D. and Bruls, E. M. J. and Baker, K. (1993) Test evaluation for complex mixed signal ICs by introducing layout dependent faults. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. , London, 6/1-8.

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Item Type: Contribution in Book/Report/Proceedings
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20629
Deposited By: ep_ss_importer
Deposited On: 02 Dec 2008 09:08
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:58
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20629

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