Lancaster EPrints

A review of testing methods for mixed signal ICs.

Harvey, R. J. A. and Bratt, A. H. and Dorey, A. P. (1993) A review of testing methods for mixed signal ICs. Microelectronics Journal, 24 (6). pp. 663-674.

Full text not available from this repository.

Abstract

Recent developments in Application Specific Integrated Circuits (ASICs), which contain analogue as well as digital components on-chip, has meant an upsurge of interest in the problems of testing. Much successful research has already been carried out in fault-testing digital ICs, but although several methods of analogue testing are being tried, no one coherent philosophy has yet been agreed upon. This paper contrasts and reports on currently favoured analogue testing methodologies, and includes a discussion, with reference to recent work undertaken by the authors, of the applicability of the power supply current monitoring technique.

Item Type: Article
Journal or Publication Title: Microelectronics Journal
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
Faculty of Science and Technology
ID Code: 20628
Deposited By: ep_ss_importer
Deposited On: 28 Nov 2008 16:57
Refereed?: No
Published?: Published
Last Modified: 26 Jul 2012 15:39
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20628

Actions (login required)

View Item