Lancaster EPrints

BIST and diagnostics for safety critical microsystems.

Olbrich, T. and Richardson, A. M. D. and Bradley, D. A. (1994) BIST and diagnostics for safety critical microsystems. In: Proceedings of an ESREF conference. , Glasgow, pp. 511-518.

Full text not available from this repository.
Item Type: Contribution in Book/Report/Proceedings
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20581
Deposited By: ep_ss_importer
Deposited On: 02 Dec 2008 15:31
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:58
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20581

Actions (login required)

View Item