Lancaster EPrints

Mixed-signal custom IC control processors incorporating design for test/self-test.

Grout, I. and Burge, S. E. and Winsby, A. J. (1998) Mixed-signal custom IC control processors incorporating design for test/self-test. In: IEE Colloquium on DSP Chips in Real Time Measurement and Control (Digest No: 1997/301). IEEE, Leicester, 1/1-1/4.

[img]
Preview
PDF (20455.pdf)
Download (427Kb) | Preview

    Abstract

    With the continued move towards higher integration and the concept of “systems on a chip”, the realisation of custom DSP chips aimed specifically at measurement/control systems is becoming a potential solution. Size reduction, operating speed increase, increased functionality and improved reliability can be achieved by using a single custom IC (ASIC) or multichip module (MCM) solution with the majority, or all, of the electronics mounted in a single package. Here, a DSP core optimised for the application surrounded by the necessary input/output signal conditioning circuitry can be used. However, the increased level of integration requires suitable fabrication processes and effective “design for test” to ensure the integrity of both the design functionality and fabrication.

    Item Type: Contribution in Book/Report/Proceedings
    Additional Information: "©1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."
    Uncontrolled Keywords: ASIC ; DSP core ; I/O signal conditioning circuitry ; MCM ; custom DSP chips ; design-for-test ; input/output signal ; conditioning circuitry ; mixed-signal custom IC control processors ; multichip module ; operating speed increase ; self-test design ; single custom IC ; size reduction ; digital signal processing chips
    Subjects: T Technology > TA Engineering (General). Civil engineering (General)
    Departments: Faculty of Science and Technology > Engineering
    ID Code: 20455
    Deposited By: ep_ss_importer
    Deposited On: 10 Dec 2008 16:37
    Refereed?: No
    Published?: Published
    Last Modified: 17 Sep 2013 18:22
    Identification Number:
    URI: http://eprints.lancs.ac.uk/id/eprint/20455

    Actions (login required)

    View Item