Olbrich, T. and Perez, J. and Grout, I. and Richardson, A. and Ferrer, C. (1996) Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In: Proceedings of the international test conference 1996. , Washington DC, pp. 511-520. ISBN 0780335406
Full text not available from this repository.| Item Type: | Contribution in Book/Report/Proceedings |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Departments: | Faculty of Science and Technology > Engineering Faculty of Science and Technology > School of Computing & Communications |
| ID Code: | 20424 |
| Deposited By: | ep_ss_importer |
| Deposited On: | 12 Dec 2008 11:51 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 26 Sep 2016 00:02 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/20424 |
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