Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

Olbrich, T. and Perez, J. and Grout, I. and Richardson, A. and Ferrer, C. (1996) Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In: Proceedings of the international test conference 1996. UNSPECIFIED, Washington DC, pp. 511-520. ISBN 0780335406

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? TA ENGINEERING (GENERAL). CIVIL ENGINEERING (GENERAL) ??
ID Code:
20424
Deposited By:
Deposited On:
12 Dec 2008 11:51
Refereed?:
No
Published?:
Published
Last Modified:
21 Nov 2022 13:18