Rosing, R. and Richardson, A. M. D. and Kerkhoff, A. and Acosta, A. (1998) Clock switching:a new design for current test (DcT) method for dynamic logic circuits. In: IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, pp. 20-25. ISBN 0818691913Full text not available from this repository.
Using an Iddq test methodology on circuits with dynamic logic tends to be problematic, mainly due to charge leakage related problems. A new Design for current Testability (DcT) method has been developed, which overcomes these problems by switching the circuit into a static mode during test. The method referred to as clock switching is applicable to both domino logic and True Single-Phase Clock (TSPC) circuits. This paper shows that this technique can lead to higher levels of Iddq testability and a reduced test vector set for the detection of bridging faults
|Item Type:||Contribution in Book/Report/Proceedings|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
|Departments:||Faculty of Science and Technology > Engineering|
|Deposited On:||17 Dec 2008 14:37|
|Last Modified:||15 Aug 2016 00:02|
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