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Clock switching: a new design for current test (DcT) method for dynamic logic circuits.

Rosing, R. and Richardson, A. M. D. and Kerkhoff, A. and Acosta, A. (1998) Clock switching: a new design for current test (DcT) method for dynamic logic circuits. Proceedings of the IEEE workshop on IDDQ testing.

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Item Type: Article
Journal or Publication Title: Proceedings of the IEEE workshop on IDDQ testing
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20389
Deposited By: ep_ss_importer
Deposited On: 17 Dec 2008 14:37
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:15
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20389

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