Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the design automation and test in Europe conference. IEEE, Paris, pp. 476-483. ISBN 0-7695-0537-6.
Efficient built-in and external test strategies are becoming essential in microelectromechanical systems (MEMS), especially for high reliability and safety critical applications. To be realistic however, internal and external test must be properly validated in terms of fault coverage. Fault simulation is hence likely to become a critical utility within the design flow. This paper discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.
|Item Type: ||Contribution in Book/Report/Proceedings|
|Additional Information: ||©2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.|
|Subjects: ||T Technology > TA Engineering (General). Civil engineering (General)|
|Departments: ||Faculty of Science and Technology > Engineering|
|ID Code: ||20310|
|Deposited By: ||ep_ss_importer|
|Deposited On: ||23 Dec 2008 09:17|
|Last Modified: ||04 Nov 2015 04:38|
|Identification Number: |
Actions (login required)