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Short circuit faults in state-of-the-art ADCs – are they hard or soft?

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Short circuit faults in state-of-the-art ADCs – are they hard or soft? In: 10th Asian Test Symposium : proceedings. IEEE Computer Society, pp. 417-422. ISBN 0769513786 9780769513782

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Item Type: Contribution in Book/Report/Proceedings
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20262
Deposited By: ep_ss_importer
Deposited On: 22 Dec 2008 13:57
Refereed?: No
Published?: Published
Last Modified: 09 Apr 2014 20:37
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20262

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