Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Short circuit faults in state-of-the-art ADCs – are they hard or soft? In: 10th Asian Test Symposium : proceedings. IEEE Computer Society, pp. 417-422. ISBN 0769513786 9780769513782
Full text not available from this repository.| Item Type: | Contribution in Book/Report/Proceedings |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 20262 |
| Deposited By: | ep_ss_importer |
| Deposited On: | 22 Dec 2008 13:57 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 26 Jul 2012 21:15 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/20262 |
Actions (login required)
| View Item |
