Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop. UNSPECIFIED, pp. 97-102.
Full text not available from this repository.| Item Type: | Contribution in Book/Report/Proceedings |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Departments: | Faculty of Science and Technology > Engineering |
| ID Code: | 20243 |
| Deposited By: | ep_ss_importer |
| Deposited On: | 19 Dec 2008 13:56 |
| Refereed?: | No |
| Published?: | Published |
| Last Modified: | 26 Jul 2012 21:15 |
| Identification Number: | |
| URI: | http://eprints.lancs.ac.uk/id/eprint/20243 |
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