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Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop. , pp. 97-102.

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Item Type: Contribution in Book/Report/Proceedings
Uncontrolled Keywords: /dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects: ?? TA ENGINEERING (GENERAL). CIVIL ENGINEERING (GENERAL) ??
Departments: Faculty of Science and Technology > Engineering
ID Code: 20243
Deposited By: ep_ss_importer
Deposited On: 19 Dec 2008 13:56
Refereed?: No
Published?: Published
Last Modified: 29 Apr 2019 11:13
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20243

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