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Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop. UNSPECIFIED, pp. 97-102.

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Item Type: Contribution in Book/Report/Proceedings
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Faculty of Science and Technology > Engineering
ID Code: 20243
Deposited By: ep_ss_importer
Deposited On: 19 Dec 2008 13:56
Refereed?: No
Published?: Published
Last Modified: 24 Jan 2014 05:56
Identification Number:
URI: http://eprints.lancs.ac.uk/id/eprint/20243

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